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34:24 CNF 30th - Nanostructures and X rays for Nano… CNF 30th - Nanostructures and X rays for Nano Characterization	CNF 30th - Nanostructures and X rays for Nano Characterization nano assembler concepts in physics reconstructed image nano science geography electron microscopy heat transfer carbon edge optical devices electronic configurations physical chemistry photography high aspect ratio nanotechnology good efficiency geography terminology diffraction pattern science of photography core level lecture trace element mapping microscopy spatial resolution non-green biomass fertility optics slight aliasing carbon loading carbon absorption double hydroxide molecular orbital infertile males quantum chemistry large diameter chemical properties dimensional focusing atomic physics geochemistry circular structures lawrence berkeley lab focal length aspect ratio structure glass physics imaging ratios zone width trace element photon energy high resolution imaging length phase contrast scientific techniques outermost zone microscopes image processing management prefectures in france ray optics physical optics core level nuclear waste geometrical optics nice point focus rapid progress high resolution absorption edge stony brook refractive focusing maximum angle good material spectroscopy pattern recognition algorithm analytical chemistry huge gain caption complete computer graphics economics terminology biochemistry nano fabrication circles nanometer resolution total internal reflection mediasite limiting factor zone plate avoid proximity black groups 3play_vodcnf_standard From Karlis Musa 10 plays Content Categories Presentations Creation Date June 14, 2007 Creator 1 First Name Christopher Creator 1 Last Name Jacobson
01:16:04 Ronchigrams Ronchigrams	Ronchigrams 2017 PARADIM SUMMER SCHOOL Ronchigrams Peter Ercius aperture size dark field detector concepts in physics smaller probe spherical aberration largest probe graduate school guy named higher order strong magnetic long time electron microscopy order terms phase change zone axis pretty easy specimen optics optical devices 0.11 nanometers fraction pattern local magnification larger aperture electron microscope corrected scope aberration corrected microscope previous images photography magnetic field raunchy gram electron phase shift stem probe convergence angle electron diffraction pattern diffraction pattern science of photography diffraction space elementary geometry post specimen rate path small screen engstrom optics objective lens circles aberration shape microns left low frequency nice probe corrected stem small amount semi angle post specimen lenses infinite magnification focus series monolithic detector seabed pattern ranch graham flat region atomic physics aberration corrected scope electron lens pretty close a.t.f. focal series diffraction button aberration correct overlap region bright field detector largest aperture high resolution wine glass carbon k.v. lot simpler image correct aberration corrected length round lens 300 k.v. quote unquote large focus radio symmetry focused probe image processing bbc radio 4 programmes contrast transfer ecclesiastical titles centimetre–gram–second system of units f.b.i. tech physical optics image shift flat phase micron diameter aperture 200 k.b. geometrical optics amorphous material alpha angle aberration corrector c.s. aberration correction shadow image sphere collaboration physical chemistry digital photography higher order aberrations beam electron diffraction f.b.i. 100 percent 2nd order csub caption complete star aberration crystallography angle high angles c.c.d. virtual detector optical axis automated alignment particle physics aberration function pixilated detector computer vision lens current atomic resolution central spike weird aberrations higher order terms perfect lens t.m. 3rd order priest specimen lenses k.b. double overlap si derived units corrected microscope diffraction single position tiny bit order spherical chemistry convergent beam electron stem From James Overhiser 157 plays
39:59 Introduction to Electron Microscopy Introduction to Electron Microscopy	Introduction to Electron Microscopy 2017 PARADIM Intro to TEM David Muller aperture size observational astronomy data sets big objects scattering individual atoms long time electron microscopy optical devices fraction pattern molecules electromagnetic potential electron microscope big fat spot atomic force microscope strong lens 1000000 volts concepts in physics photography magnetic field c.c.d. camera numerical aperture 1st thing diffraction limited zation damage diffraction pattern huge cross sections charge carriers spherical aberration microscopy big angles optics objective lens chip failed 1st electron bacteria optical microscope radiation damage atomic physics imaging mode uniformly illuminated electron lens electron beam aberration correct magnetism lens action energy loss s.c.m. magnetic lens scientific techniques microscopes optic axis statistics accelerator physics transmission electron microscope geometrical optics science of photography scanning electron microscope incredibly incredibly tiny knowledge representation projectile lenses diffraction spot physical quantities digital photography diffraction blur objective aperture viewing screen magnetostatics condenser lens caption complete free space c.c.d. scattering mechanism particle physics electron gun great amount small spot atomic resolution single transistor time varying field elastic scattering high voltage t.m. electromagnetism charged particles electron military equipment academic administration losses equation From James Overhiser 158 plays
01:01:34 Linear Imaging Theory Linear Imaging Theory	Linear Imaging Theory 2017 PARADIM Linear Imaging Theory Robert Hovden d.n.a. dark field aperture size object function total intensity collaboration increases concepts in physics convergence angle area spherical aberration wide range covering today geometric shapes d.n.a. structure central minimum electron microscopy focal point intensity increases linear imaging model wave vectors control theory optical devices collection angle larger aperture electron microscope high angle architectural elements signal processing photography high pass filter transfer function uncorrected system phase shift darkfield regime functional form scattered electrons higher frequency bright field stem egyptian artefact types diffraction pattern science of photography point spread function high intensity probe elementary geometry integrals spatial frequency optics objective lens bright field regime bright spots real space low frequency reciprocal space blurring contribution sphere collaboration uncorrected instrument characteristic dimension incoherent imaging condition surfaces aperture function wave front atomic physics imaging mode contract transfer function white noise scanning transmission electron cohere imaging previous lecture distant plane elementary shapes stem higher angles high resolution incoherent linear image mil rating detector geometries field cone geometry types of functions aberration corrected constant phase length lower frequencies chromatic aberration conic sections amplitude squared aberration free scientific techniques microscopes measuring instruments intensity squared optic axis intensity decreases contrast transfer diffraction limit stem image individual atom radio spectrum incoherent imaging quantum mechanics aberration free probe multivariable calculus people meters focal plane bright field low angle amateur radio systems theory image plane coherent imaging condition collecting electrons blurring function transmission electron microscopy physical quantities digital photography angular spread double integral coherent imaging largest range face shift higher order aberrations raleigh criterion pio fairly interpretable transmission electron microscope square pulse geometrical optics digital signal processing 1st order caption complete probe tails nyquist limit blue curve subroutines broadcasting filter frequency response maximum frequency high frequency caustic curve hand side low pass filter spatial coordinates atoms closer coherent image sparrow criterion structural system pico meter dark background frequency space optimal aperture t.m. complex conjugate contrast transfer function wave function measure ultimately imaging condition annular darkfield incoherent imaging mode atomic number field stem atomic column inelastic interactions nobel prize angle medium chemistry focal imaging probe size From James Overhiser 103 plays
48:34 Core Loss EELS, EDX Core Loss EELS, EDX	Core Loss EELS, EDX 2017 PARADIM Core loss EELS Lena Kourkoutis specific element fine structure violence lower energy noise level statistical mechanics huge increase elastic contrast concepts in physics metals atomic scale huge problem chemical elements noise e.t.f. image emotions power law nitrides transition metals image processing particle physics energy edges caption complete electronic structure spectroscopic mapping t.m. electron collection angus scales specific edge ironic compound optical devices high energy reducing agents collection angle good amount transition metal scientific terminology pyrotechnic fuels spectroscopic map biology and pharmacology of chemical elements nuclear physics energy resolution tails of probability distributions afternoon session photography semiconductor materials inelastic scattering 1st peak entrance aperture anthropology silicon edge single spectrum collection anger energy loss metalloids scattered electrons probability theory emotion physical quantities digital photography elastic signal occupied density science of photography high energy losses geometry low energy local background white lines strong peak microscopy small collection data set dietary minerals face contrast atomic number background subtraction spectroscopy diffraction contrast atomic physics free path binding energy optics e.t.f. 2nd peak From James Overhiser 91 plays
33:00 CNF NanoCourses 2004 – Section 4.1:… CNF NanoCourses 2004 – Section 4.1: Introduction and Optic	CNF NanoCourses 2004 – Section 4.1: Introduction and Optic length physical chemistry calculations sociology of culture charge carriers observational astronomy scientific techniques geometrical optics computer graphics maintenance caption complete fiber optics digital photography characterization optical spectrum quantum electrodynamics magnification absorption and radiative transfer (optics) architectural elements human eye anatomy information science concepts in physics thermodynamics optical devices analytical chemistry polarization visual system science of photography physical optics elementary geometry electron field microscopes materials science internet objective reliability engineering assumptions resolution social psychology color economics terminology composition historical scientific instruments meteorology scattering explorer program spectroscopy robotics microscope technique eyepiece microscopy picture spacecraft launched by delta ii rockets photography illumination 3play_vodcnf_standard From David Botsch 139 plays
28:20 CNF NanoCourses 2004 – Section 4.2: SEM… CNF NanoCourses 2004 – Section 4.2: SEM (Daron Westly)	CNF NanoCourses 2004 – Section 4.2: SEM (Daron Westly) architectural elements occupational safety and health industrial processes information theory polymers coatings metal plating atomic physics soil contamination electromagnetic radiation materials science low energy parliamentary procedure scattering communication neuroscience detector sample resolution solvents optical devices energy high resolution technology digital photography electrical components science of photography american brands good resolution focus web colors scientific classification s.c.m. magnification concepts in physics s.t.m. fluid dynamics structural system substrate electron film and video terminology photography applied and interdisciplinary physics high energy meaning (philosophy of language) metals absorption and radiative transfer (optics) electromagnetism image processing egyptian artefact types vision geometrical optics chemical elements caption complete natural philosophy system 3play_vodcnf_standard From David Botsch 123 plays
45:44 CNF NanoCourses 2004 – Section 1.2:… CNF NanoCourses 2004 – Section 1.2: Photolithography, Part	CNF NanoCourses 2004 – Section 1.2: Photolithography, Part June 2004 microscopy mirrors spacecraft launched by delta ii rockets digital photography particulates t.g. lithography (microfabrication) computer programming thing pretty simple concepts in physics communication alignment cybernetics arc lamp u.v computer graphics light source optical devices computing terminology geometrical optics topology glass applications lighting glass laboratory equipment laser building materials stopper photo resist length classical mechanics historical scientific instruments systems science electronic engineering art tools contact feature metrology semiconductor device fabrication heat transfer data management physical sciences micron masks philosophy of mathematics group theory inch wafers structure civil procedure diffraction light wafer optics trigonometry printing materials image philosophical terminology u.v. point aesthetics caption complete wavelength design industrial processes microscopes systems theory packaging materials analytic geometry input/output systems explorer program photography pain materials science big problem suffering geometry elementary mathematics information theory science of photography problem superstitions directed-energy weapons elementary special functions stepper arts electronics elementary algebra thermodynamics algebra systems engineering dielectrics latin alphabet 3play_vodcnf_standard From David Botsch 327 plays