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49:06 CNF 30th (2007) "Manufacturing at the… CNF 30th (2007) "Manufacturing at the Nanoscale" with Williams	CNF 30th (2007) "Manufacturing at the Nanoscale" with Williams CNF 30th Anniversary (2007) Invited Speaker, "Manufacturing at the Nanoscale" with R. Stanley Williams electronic engineering viscous liquid american electrical engineers logic families 100 microns electronics terminology scientific techniques microscope image feature size graphic design daughter mold invented digital nanometer feature size entire imprint implication logic current loops animated feature size gallium arsenide nand gate hewlett packard nano imprint quantum science caption complete terminal devices national medal of technology recipients handed material david packard force microscope perfect lens imprint machine real problem international technology roadmap for semiconductors lithography nodes nanometer pitch optical devices receiving latch bertrand russell material implication scale systems pitch features original mold electron microscope microscopes physical chemistry called nano emerging technologies nano scale lawrence berkeley supramolecular chemistry cryptography memory vapor phase years ahead assembled monolayer printmaking left handed imprint module 1st started pump probe experiment square microns mediasite lithography (microfabrication) semantics multiplexing imprint lithography graduate student grammar phases of matter half pitch electronic circuits nanometer half kilobit memory manufacturing capability microscopy double negative digital electronics platinum film future size electron beam nanometer half pitch left hand 3play_vodcnf_standard From Karlis Musa 13 plays
01:16:04 Ronchigrams Ronchigrams	Ronchigrams 2017 PARADIM SUMMER SCHOOL Ronchigrams Peter Ercius aperture size dark field detector concepts in physics smaller probe spherical aberration largest probe graduate school guy named higher order strong magnetic long time electron microscopy order terms phase change zone axis pretty easy specimen optics optical devices 0.11 nanometers fraction pattern local magnification larger aperture electron microscope corrected scope aberration corrected microscope previous images photography magnetic field raunchy gram electron phase shift stem probe convergence angle electron diffraction pattern diffraction pattern science of photography diffraction space elementary geometry post specimen rate path small screen engstrom optics objective lens circles aberration shape microns left low frequency nice probe corrected stem small amount semi angle post specimen lenses infinite magnification focus series monolithic detector seabed pattern ranch graham flat region atomic physics aberration corrected scope electron lens pretty close a.t.f. focal series diffraction button aberration correct overlap region bright field detector largest aperture high resolution wine glass carbon k.v. lot simpler image correct aberration corrected length round lens 300 k.v. quote unquote large focus radio symmetry focused probe image processing bbc radio 4 programmes contrast transfer ecclesiastical titles centimetre–gram–second system of units f.b.i. tech physical optics image shift flat phase micron diameter aperture 200 k.b. geometrical optics amorphous material alpha angle aberration corrector c.s. aberration correction shadow image sphere collaboration physical chemistry digital photography higher order aberrations beam electron diffraction f.b.i. 100 percent 2nd order csub caption complete star aberration crystallography angle high angles c.c.d. virtual detector optical axis automated alignment particle physics aberration function pixilated detector computer vision lens current atomic resolution central spike weird aberrations higher order terms perfect lens t.m. 3rd order priest specimen lenses k.b. double overlap si derived units corrected microscope diffraction single position tiny bit order spherical chemistry convergent beam electron stem From James Overhiser 181 plays