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01:00:53 Chemical by Design (2 of 3) (McQueen-Lecture2) Chemical by Design (2 of 3) (McQueen-Lecture2)	Chemical by Design (2 of 3) (McQueen-Lecture2) 2019 JHU Summer School chemical potential state functions real space personal life concepts in physics small amount extended effects rare earth systematic errors concentration caption complete long time thought heat transfer temperature c.c.d. atomic physics high pressure thermodynamics potential semantics local structure pretty good composition physical chemistry materials science particle correlation algebra photography scientific classification basically condition knowledge reaction chemistry high level positive mental attitude positive psychology charge carriers free energy emotions gassy species thing physical quantities problem reaction pathway vision c.c.d. detector From James Overhiser 44 plays
01:00:53 How Data Changes Materials and Synthesis by… How Data Changes Materials and Synthesis by Design ( McQueen)	How Data Changes Materials and Synthesis by Design ( McQueen) 2019 JHU Summer School chemical potential real space characteristics concepts in physics number internet slang small amount extended effects systematic errors concentration nationalism caption complete 1st week temperature c.c.d. charge carriers materials high pressure thermodynamics potential semantics conditions composition physical chemistry materials science material pressure scientific classification representative structure reaction property high level property law diffraction free energy thought thing political philosophy military equipment economic anthropology problem reaction pathway From James Overhiser 47 plays
01:16:04 Ronchigrams Ronchigrams	Ronchigrams 2017 PARADIM SUMMER SCHOOL Ronchigrams Peter Ercius aperture size dark field detector concepts in physics smaller probe spherical aberration largest probe graduate school guy named higher order strong magnetic long time electron microscopy order terms phase change zone axis pretty easy specimen optics optical devices 0.11 nanometers fraction pattern local magnification larger aperture electron microscope corrected scope aberration corrected microscope previous images photography magnetic field raunchy gram electron phase shift stem probe convergence angle electron diffraction pattern diffraction pattern science of photography diffraction space elementary geometry post specimen rate path small screen engstrom optics objective lens circles aberration shape microns left low frequency nice probe corrected stem small amount semi angle post specimen lenses infinite magnification focus series monolithic detector seabed pattern ranch graham flat region atomic physics aberration corrected scope electron lens pretty close a.t.f. focal series diffraction button aberration correct overlap region bright field detector largest aperture high resolution wine glass carbon k.v. lot simpler image correct aberration corrected length round lens 300 k.v. quote unquote large focus radio symmetry focused probe image processing bbc radio 4 programmes contrast transfer ecclesiastical titles centimetre–gram–second system of units f.b.i. tech physical optics image shift flat phase micron diameter aperture 200 k.b. geometrical optics amorphous material alpha angle aberration corrector c.s. aberration correction shadow image sphere collaboration physical chemistry digital photography higher order aberrations beam electron diffraction f.b.i. 100 percent 2nd order csub caption complete star aberration crystallography angle high angles c.c.d. virtual detector optical axis automated alignment particle physics aberration function pixilated detector computer vision lens current atomic resolution central spike weird aberrations higher order terms perfect lens t.m. 3rd order priest specimen lenses k.b. double overlap si derived units corrected microscope diffraction single position tiny bit order spherical chemistry convergent beam electron stem From James Overhiser 181 plays
39:59 Introduction to Electron Microscopy Introduction to Electron Microscopy	Introduction to Electron Microscopy 2017 PARADIM Intro to TEM David Muller aperture size observational astronomy data sets big objects scattering individual atoms long time electron microscopy optical devices fraction pattern molecules electromagnetic potential electron microscope big fat spot atomic force microscope strong lens 1000000 volts concepts in physics photography magnetic field c.c.d. camera numerical aperture 1st thing diffraction limited zation damage diffraction pattern huge cross sections charge carriers spherical aberration microscopy big angles optics objective lens chip failed 1st electron bacteria optical microscope radiation damage atomic physics imaging mode uniformly illuminated electron lens electron beam aberration correct magnetism lens action energy loss s.c.m. magnetic lens scientific techniques microscopes optic axis statistics accelerator physics transmission electron microscope geometrical optics science of photography scanning electron microscope incredibly incredibly tiny knowledge representation projectile lenses diffraction spot physical quantities digital photography diffraction blur objective aperture viewing screen magnetostatics condenser lens caption complete free space c.c.d. scattering mechanism particle physics electron gun great amount small spot atomic resolution single transistor time varying field elastic scattering high voltage t.m. electromagnetism charged particles electron military equipment academic administration losses equation From James Overhiser 172 plays
01:29:35 Intro to EELS (Part 1) Intro to EELS (Part 1)	Intro to EELS (Part 1) 2017 PARADIM Intro to EELS part 1 Paolo Longo c.l. chemical shift concepts in physics inelastic interaction core shell components component reference spectrum criminal law conversion factor ontology (information science) d.s. chemical face chemical analysis nuclear physics electrons coming deal suspect decelerating voltage large area equally scott conduction bend reference scouting events suspect romeo microscopy measurement b.c. integration window coral select relative amount conventional microscope atomic physics scientific terminology pretty good nano particles historical scientific instruments t.v. energy field spectrum integral silicone oxide energy loss geometry elemental mapping e.l.c. logic m.l.s. fine structure eagerly scott spectrum imaging philosophical logic single detector anions eel suspect full spectrum quantum mechanics data management collection angle windows method e.d.s. coral sea region flowers semantics plants physical quantities electromagnetic spectrum pretty edge 2nd blossom spectroscopy l.a. elsa spectrum aluminum alleviate fin specimen protocol session caption complete low energy angle c.c.d. def jam upper level total spectrum entire spectrum optical spectrum scientific classification t.m. bulk silicone good energy energy range reading voltage extended fine structure From James Overhiser 99 plays
46:22 Introduction to EELS (Part 2) Introduction to EELS (Part 2)	Introduction to EELS (Part 2) 2017 PARADIM Intro to EELS part 2 Paolo Longo atomic level state functions f.b.i. chemical shift philosophical terminology concepts in physics metals real fast pixel time chemical elements noise switch energy cubic minerals transition metals video energy image processing caption complete vertical binning ontology c.c.d. quantum mechanics metallurgy energy drift optical devices scientific terminology collection angle recollection angle semiconductor materials pyrotechnic fuels chemical analysis huge amount energy resolution historical scientific instruments spectroscopy beam sitting lot smaller latest version astronomical instruments e.d.s. digital micrograph fasting pretty hard 1st thing convergence angle graphic layers superhard materials building materials physical quantities digital photography photography equipment ferromagnetic materials gemstones energy range geometry pretty large camera lens biology and pharmacology of chemical elements time series microscopy carbides thought dietary minerals laboratory equipment iron stable microscope cognition silicon carbide valves e.l.c. core loss From James Overhiser 65 plays
$Thumbnail for entry Diffraction (Part 2)$ 01:07:41 Diffraction (Part 2) Diffraction (Part 2)	Diffraction (Part 2) 2017 PARADIM Diffraction part 2 David Muller central beam noise source aperture size n.c. concepts in physics ideal d.q. 2nd thing readout noise high dynamic range mental plane thermal noise long time channel gain variations quantum electrodynamics digital imaging count rate optical devices fraction pattern pico amps long range biological imaging range electric fields huge amount signal processing geology d.p. photography thin pixel magnetic field hole pez c.c.d. camera electronics poisson distribution diffraction pattern electron hope point spread function 200 kilovolts $16.00 pico amps neighboring pixel square root mass signal standard deviation detective quantum efficiency spatial frequency optics real space research methods energy distribution magnetic ripples d.q. single electron sensitivity particle physics narrow pixel space measurement slowly varying abled sphere atomic physics imaging mode electric field energy deposited minus sigma pretty good emerging technologies electron beam noise dynamic range point $16.00 pico magnetism dock noise soft moon k.v. pulse counting detector lastic imaging modes e.q. low energy pretty darn good electrons arrive micron pixel fire electron random noise microscopes perfectly linear discrete distributions electron produces mass image percent variation technical details electron hole pay q.e. statistics electrostatics electronics terminology quantum mechanics field image single actor ideal detector multiple pixels grain contrast systems theory electron hole 1st time high count rates charge carriers huge number diffraction spot physical quantities digital photography full diffraction pattern noise time pulse counting beam energy high voltages output noise milli 2nd dynamical systems output signal low count rate dimensional data digital signal processing momentum transfer caption complete $150.00 micron information pixel array detector c.c.d. 1000 electrons laboratory equipment cybernetics atomic resolution scientific method finite size fundamental limit noise ratio fraction spot quantum chemistry t.m. data evaluation methods electromagnetism momentum operator incident electron diffraction probability current flow rough rule beam current wave function diffraction work From James Overhiser 123 plays