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01:16:04 Ronchigrams Ronchigrams	Ronchigrams 2017 PARADIM SUMMER SCHOOL Ronchigrams Peter Ercius aperture size dark field detector concepts in physics smaller probe spherical aberration largest probe graduate school guy named higher order strong magnetic long time electron microscopy order terms phase change zone axis pretty easy specimen optics optical devices 0.11 nanometers fraction pattern local magnification larger aperture electron microscope corrected scope aberration corrected microscope previous images photography magnetic field raunchy gram electron phase shift stem probe convergence angle electron diffraction pattern diffraction pattern science of photography diffraction space elementary geometry post specimen rate path small screen engstrom optics objective lens circles aberration shape microns left low frequency nice probe corrected stem small amount semi angle post specimen lenses infinite magnification focus series monolithic detector seabed pattern ranch graham flat region atomic physics aberration corrected scope electron lens pretty close a.t.f. focal series diffraction button aberration correct overlap region bright field detector largest aperture high resolution wine glass carbon k.v. lot simpler image correct aberration corrected length round lens 300 k.v. quote unquote large focus radio symmetry focused probe image processing bbc radio 4 programmes contrast transfer ecclesiastical titles centimetre–gram–second system of units f.b.i. tech physical optics image shift flat phase micron diameter aperture 200 k.b. geometrical optics amorphous material alpha angle aberration corrector c.s. aberration correction shadow image sphere collaboration physical chemistry digital photography higher order aberrations beam electron diffraction f.b.i. 100 percent 2nd order csub caption complete star aberration crystallography angle high angles c.c.d. virtual detector optical axis automated alignment particle physics aberration function pixilated detector computer vision lens current atomic resolution central spike weird aberrations higher order terms perfect lens t.m. 3rd order priest specimen lenses k.b. double overlap si derived units corrected microscope diffraction single position tiny bit order spherical chemistry convergent beam electron stem From James Overhiser 156 plays
39:59 Introduction to Electron Microscopy Introduction to Electron Microscopy	Introduction to Electron Microscopy 2017 PARADIM Intro to TEM David Muller aperture size observational astronomy data sets big objects scattering individual atoms long time electron microscopy optical devices fraction pattern molecules electromagnetic potential electron microscope big fat spot atomic force microscope strong lens 1000000 volts concepts in physics photography magnetic field c.c.d. camera numerical aperture 1st thing diffraction limited zation damage diffraction pattern huge cross sections charge carriers spherical aberration microscopy big angles optics objective lens chip failed 1st electron bacteria optical microscope radiation damage atomic physics imaging mode uniformly illuminated electron lens electron beam aberration correct magnetism lens action energy loss s.c.m. magnetic lens scientific techniques microscopes optic axis statistics accelerator physics transmission electron microscope geometrical optics science of photography scanning electron microscope incredibly incredibly tiny knowledge representation projectile lenses diffraction spot physical quantities digital photography diffraction blur objective aperture viewing screen magnetostatics condenser lens caption complete free space c.c.d. scattering mechanism particle physics electron gun great amount small spot atomic resolution single transistor time varying field elastic scattering high voltage t.m. electromagnetism charged particles electron military equipment academic administration losses equation From James Overhiser 158 plays
01:01:34 Linear Imaging Theory Linear Imaging Theory	Linear Imaging Theory 2017 PARADIM Linear Imaging Theory Robert Hovden d.n.a. dark field aperture size object function total intensity collaboration increases concepts in physics convergence angle area spherical aberration wide range covering today geometric shapes d.n.a. structure central minimum electron microscopy focal point intensity increases linear imaging model wave vectors control theory optical devices collection angle larger aperture electron microscope high angle architectural elements signal processing photography high pass filter transfer function uncorrected system phase shift darkfield regime functional form scattered electrons higher frequency bright field stem egyptian artefact types diffraction pattern science of photography point spread function high intensity probe elementary geometry integrals spatial frequency optics objective lens bright field regime bright spots real space low frequency reciprocal space blurring contribution sphere collaboration uncorrected instrument characteristic dimension incoherent imaging condition surfaces aperture function wave front atomic physics imaging mode contract transfer function white noise scanning transmission electron cohere imaging previous lecture distant plane elementary shapes stem higher angles high resolution incoherent linear image mil rating detector geometries field cone geometry types of functions aberration corrected constant phase length lower frequencies chromatic aberration conic sections amplitude squared aberration free scientific techniques microscopes measuring instruments intensity squared optic axis intensity decreases contrast transfer diffraction limit stem image individual atom radio spectrum incoherent imaging quantum mechanics aberration free probe multivariable calculus people meters focal plane bright field low angle amateur radio systems theory image plane coherent imaging condition collecting electrons blurring function transmission electron microscopy physical quantities digital photography angular spread double integral coherent imaging largest range face shift higher order aberrations raleigh criterion pio fairly interpretable transmission electron microscope square pulse geometrical optics digital signal processing 1st order caption complete probe tails nyquist limit blue curve subroutines broadcasting filter frequency response maximum frequency high frequency caustic curve hand side low pass filter spatial coordinates atoms closer coherent image sparrow criterion structural system pico meter dark background frequency space optimal aperture t.m. complex conjugate contrast transfer function wave function measure ultimately imaging condition annular darkfield incoherent imaging mode atomic number field stem atomic column inelastic interactions nobel prize angle medium chemistry focal imaging probe size From James Overhiser 103 plays
$Thumbnail for entry Diffraction (Part 2)$ 01:07:41 Diffraction (Part 2) Diffraction (Part 2)	Diffraction (Part 2) 2017 PARADIM Diffraction part 2 David Muller central beam noise source aperture size n.c. concepts in physics ideal d.q. 2nd thing readout noise high dynamic range mental plane thermal noise long time channel gain variations quantum electrodynamics digital imaging count rate optical devices fraction pattern pico amps long range biological imaging range electric fields huge amount signal processing geology d.p. photography thin pixel magnetic field hole pez c.c.d. camera electronics poisson distribution diffraction pattern electron hope point spread function 200 kilovolts $16.00 pico amps neighboring pixel square root mass signal standard deviation detective quantum efficiency spatial frequency optics real space research methods energy distribution magnetic ripples d.q. single electron sensitivity particle physics narrow pixel space measurement slowly varying abled sphere atomic physics imaging mode electric field energy deposited minus sigma pretty good emerging technologies electron beam noise dynamic range point $16.00 pico magnetism dock noise soft moon k.v. pulse counting detector lastic imaging modes e.q. low energy pretty darn good electrons arrive micron pixel fire electron random noise microscopes perfectly linear discrete distributions electron produces mass image percent variation technical details electron hole pay q.e. statistics electrostatics electronics terminology quantum mechanics field image single actor ideal detector multiple pixels grain contrast systems theory electron hole 1st time high count rates charge carriers huge number diffraction spot physical quantities digital photography full diffraction pattern noise time pulse counting beam energy high voltages output noise milli 2nd dynamical systems output signal low count rate dimensional data digital signal processing momentum transfer caption complete $150.00 micron information pixel array detector c.c.d. 1000 electrons laboratory equipment cybernetics atomic resolution scientific method finite size fundamental limit noise ratio fraction spot quantum chemistry t.m. data evaluation methods electromagnetism momentum operator incident electron diffraction probability current flow rough rule beam current wave function diffraction work From James Overhiser 81 plays