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Electron Tomography - Practical Aspects duration 56 minutes 17 seconds Electron Tomography - Practical Aspects Electron Tomography - Practical Aspects	Electron Tomography - Practical Aspects 2017 PARADIM SUMMER SCHOOL Practical Tomography Robert Hovden dimensional space degree tilt hot pixel surface rendering low tilt projection requirement chemical elements slab geometry tilt series symbols of utah transparency curve medium filter vertical direction image shift reconstruction quality operation size signal processing small gold high quality reconstruction uncorrected system center mass 1st thing convergence angle electronics symbols single projection single axis original object telegraphic reconstruction real space high values hand side post processing tomography holder stem tomography s.d.o. high tilt slight crescent moon 180 degree typical data set cross correlation high intensity crescent moon shape biology and pharmacology of chemical elements noise filtering segmentation candy wrapper bounding box nano particles dynamic range graphic reconstruction medical imaging intensity values tilt axis cubic minerals contour surface linear drift higher resolution tilt angle assess reconstruction good alignment center ground natural feel morphological operation manual alignment higher intensity copper bars demographic reconstruction length alignment procedure focal plane $180.00 degrees 3d computer graphics bilinear operators nano cube data set carbon support aberration corrected tool defined peaks center particle peek representing politics dynamic focusing caption complete reconstruction post processing color map fit lots center object directional case higher tilt peter talked tilt range alignment quality gal shambler fully opaque projection image minus $75.00 gold particles low values covariance and correlation traditional tomography regime object size $32.00 bit materials electrical conductors elementary mathematics From James Overhiser 57 plays
$Thumbnail for Diffraction (Part 2)$ Diffraction (Part 2) duration 1 hour 7 minutes Diffraction (Part 2) Diffraction (Part 2)	Diffraction (Part 2) 2017 PARADIM Diffraction part 2 David Muller central beam noise source aperture size n.c. concepts in physics ideal d.q. 2nd thing readout noise high dynamic range mental plane thermal noise long time channel gain variations quantum electrodynamics digital imaging count rate optical devices fraction pattern pico amps long range biological imaging range electric fields huge amount signal processing geology d.p. photography thin pixel magnetic field hole pez c.c.d. camera electronics poisson distribution diffraction pattern electron hope point spread function 200 kilovolts $16.00 pico amps neighboring pixel square root mass signal standard deviation detective quantum efficiency spatial frequency optics real space research methods energy distribution magnetic ripples d.q. single electron sensitivity particle physics narrow pixel space measurement slowly varying abled sphere atomic physics imaging mode electric field energy deposited minus sigma pretty good emerging technologies electron beam noise dynamic range point $16.00 pico magnetism dock noise soft moon k.v. pulse counting detector lastic imaging modes e.q. low energy pretty darn good electrons arrive micron pixel fire electron random noise microscopes perfectly linear discrete distributions electron produces mass image percent variation technical details electron hole pay q.e. statistics electrostatics electronics terminology quantum mechanics field image single actor ideal detector multiple pixels grain contrast systems theory electron hole 1st time high count rates charge carriers huge number diffraction spot physical quantities digital photography full diffraction pattern noise time pulse counting beam energy high voltages output noise milli 2nd dynamical systems output signal low count rate dimensional data digital signal processing momentum transfer caption complete $150.00 micron information pixel array detector c.c.d. 1000 electrons laboratory equipment cybernetics atomic resolution scientific method finite size fundamental limit noise ratio fraction spot quantum chemistry t.m. data evaluation methods electromagnetism momentum operator incident electron diffraction probability current flow rough rule beam current wave function diffraction work From James Overhiser 145 plays