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noise source
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Diffraction (Part 2)
01:07:41
duration 1 hour 7 minutes
Diffraction (Part 2)
Diffraction (Part 2)
Diffraction (Part 2)
2017 PARADIM Diffraction part 2 David Muller
central beam
noise source
aperture size
n.c.
concepts in physics
ideal d.q.
2nd thing
readout noise
high dynamic range
mental plane
thermal noise
long time
channel gain variations
quantum electrodynamics
digital imaging
count rate
optical devices
fraction pattern
pico amps
long range
biological imaging
range electric fields
huge amount
signal processing
geology
d.p.
photography
thin pixel
magnetic field
hole pez
c.c.d. camera
electronics
poisson distribution
diffraction pattern
electron hope
point spread function
200 kilovolts
$16.00 pico amps
neighboring pixel
square root
mass signal
standard deviation
detective quantum efficiency
spatial frequency
optics
real space
research methods
energy distribution
magnetic ripples
d.q.
single electron sensitivity
particle physics
narrow pixel
space measurement
slowly varying
abled sphere
atomic physics
imaging mode
electric field
energy deposited
minus sigma
pretty good
emerging technologies
electron beam
noise
dynamic range
point $16.00 pico
magnetism
dock noise
soft moon
k.v.
pulse counting detector
lastic imaging modes
e.q.
low energy
pretty darn good
electrons arrive
micron pixel
fire electron
random noise
microscopes
perfectly linear
discrete distributions
electron produces
mass image
percent variation
technical details
electron hole pay
q.e.
statistics
electrostatics
electronics terminology
quantum mechanics
field image
single actor
ideal detector
multiple pixels
grain contrast
systems theory
electron hole
1st time
high count rates
charge carriers
huge number
diffraction spot
physical quantities
digital photography
full diffraction pattern
noise time
pulse counting
beam energy
high voltages
output noise
milli 2nd
dynamical systems
output signal
low count rate
dimensional data
digital signal processing
momentum transfer
caption complete
$150.00 micron
information
pixel array detector
c.c.d.
1000 electrons
laboratory equipment
cybernetics
atomic resolution
scientific method
finite size
fundamental limit
noise ratio
fraction spot
quantum chemistry
t.m.
data
evaluation methods
electromagnetism
momentum operator
incident electron
diffraction
probability current flow
rough rule
beam current
wave function
diffraction work
From
James Overhiser
|
145
145 plays