Search for tag: "force microscope"

2 Media

49:06 CNF 30th (2007) "Manufacturing at the… CNF 30th (2007) "Manufacturing at the Nanoscale" with Williams	CNF 30th (2007) "Manufacturing at the Nanoscale" with Williams CNF 30th Anniversary (2007) Invited Speaker, "Manufacturing at the Nanoscale" with R. Stanley Williams electronic engineering viscous liquid american electrical engineers logic families 100 microns electronics terminology scientific techniques microscope image feature size graphic design daughter mold invented digital nanometer feature size entire imprint implication logic current loops animated feature size gallium arsenide nand gate hewlett packard nano imprint quantum science caption complete terminal devices national medal of technology recipients handed material david packard force microscope perfect lens imprint machine real problem international technology roadmap for semiconductors lithography nodes nanometer pitch optical devices receiving latch bertrand russell material implication scale systems pitch features original mold electron microscope microscopes physical chemistry called nano emerging technologies nano scale lawrence berkeley supramolecular chemistry cryptography memory vapor phase years ahead assembled monolayer printmaking left handed imprint module 1st started pump probe experiment square microns mediasite lithography (microfabrication) semantics multiplexing imprint lithography graduate student grammar phases of matter half pitch electronic circuits nanometer half kilobit memory manufacturing capability microscopy double negative digital electronics platinum film future size electron beam nanometer half pitch left hand 3play_vodcnf_standard From Karlis Musa 13 plays Content Categories Presentations Creation Date June 14, 2007 Creator 1 First Name R. Stanley Creator 1 Last Name Williams
39:59 Introduction to Electron Microscopy Introduction to Electron Microscopy	Introduction to Electron Microscopy 2017 PARADIM Intro to TEM David Muller aperture size observational astronomy data sets big objects scattering individual atoms long time electron microscopy optical devices fraction pattern molecules electromagnetic potential electron microscope big fat spot atomic force microscope strong lens 1000000 volts concepts in physics photography magnetic field c.c.d. camera numerical aperture 1st thing diffraction limited zation damage diffraction pattern huge cross sections charge carriers spherical aberration microscopy big angles optics objective lens chip failed 1st electron bacteria optical microscope radiation damage atomic physics imaging mode uniformly illuminated electron lens electron beam aberration correct magnetism lens action energy loss s.c.m. magnetic lens scientific techniques microscopes optic axis statistics accelerator physics transmission electron microscope geometrical optics science of photography scanning electron microscope incredibly incredibly tiny knowledge representation projectile lenses diffraction spot physical quantities digital photography diffraction blur objective aperture viewing screen magnetostatics condenser lens caption complete free space c.c.d. scattering mechanism particle physics electron gun great amount small spot atomic resolution single transistor time varying field elastic scattering high voltage t.m. electromagnetism charged particles electron military equipment academic administration losses equation From James Overhiser 147 plays