Search for tag: "thin pixel"

Diffraction (Part 2)

2017 PARADIM Diffraction part 2 David Muller

central beamnoise sourceaperture sizen.c.concepts in physicsideal d.q.2nd thingreadout noisehigh dynamic rangemental planethermal noiselong timechannel gain variationsquantum electrodynamicsdigital imagingcount rateoptical devicesfraction patternpico ampslong rangebiological imagingrange electric fieldshuge amountsignal processinggeologyd.p.photographythin pixelmagnetic fieldhole pezc.c.d. cameraelectronicspoisson distributiondiffraction patternelectron hopepoint spread function200 kilovolts$16.00 pico ampsneighboring pixelsquare rootmass signalstandard deviationdetective quantum efficiencyspatial frequencyopticsreal spaceresearch methodsenergy distributionmagnetic ripplesd.q.single electron sensitivityparticle physicsnarrow pixelspace measurementslowly varyingabled sphereatomic physicsimaging modeelectric fieldenergy depositedminus sigmapretty goodemerging technologieselectron beamnoisedynamic rangepoint $16.00 picomagnetismdock noisesoft moonk.v.pulse counting detectorlastic imaging modese.q.low energypretty darn goodelectrons arrivemicron pixelfire electronrandom noisemicroscopesperfectly lineardiscrete distributionselectron producesmass imagepercent variationtechnical detailselectron hole payq.e.statisticselectrostaticselectronics terminologyquantum mechanicsfield imagesingle actorideal detectormultiple pixelsgrain contrastsystems theoryelectron hole1st timehigh count ratescharge carriershuge numberdiffraction spotphysical quantitiesdigital photographyfull diffraction patternnoise timepulse countingbeam energyhigh voltagesoutput noisemilli 2nddynamical systemsoutput signallow count ratedimensional datadigital signal processingmomentum transfercaption complete$150.00 microninformationpixel array detectorc.c.d.1000 electronslaboratory equipmentcyberneticsatomic resolutionscientific methodfinite sizefundamental limitnoise ratiofraction spotquantum chemistryt.m.dataevaluation methodselectromagnetismmomentum operatorincident electrondiffractionprobability current flowrough rulebeam currentwave functiondiffraction work
From  James Overhiser on February 15th, 2019 15 plays

CNF NanoCourses 2004 – Section 1.4: E-Beam Lithography (Al

spintronicsdigital photographye.b.m.analytic geometrychemical propertiessemiconductor device fabricationcadgeometric shapescaption completecommunication designnatural philosophygraphic designscatteringnanometerstructural engineeringgeometrypatternmechanical vibrationselectrical componentsscience and technology in spainlithography (microfabrication)electrical engineeringp.m.a.optical devicescartographyhistorical scientific instrumentssystemabsorption and radiative transfer (optics)dielectricsaudio engineeringalgebrametalsphotonicsexposequantum electrodynamicsfieldelectronicssemiconductor materialsprintmakingmechanicsmeterlensesgeodesysystems theoryelectroncomputer graphicsearthquake engineeringvideo signalelectronic engineeringk.b.colormicroscopesimage processingspectroscopykinematicsaestheticselectromagnetismnavigational equipmentquantum mechanicssurfacesalignmentclassical mechanicsparticle physicsi.c.m.architectural elementssystemsphotographyaudio effectsnandquadrilateralspixelvisiongeography terminologydietary mineralsphilosophical terminologyopticsdimensional instrumentsthin film depositionmaterials scienceforceegyptian artefact typesbiology and pharmacology of chemical elementsstructureresolutioni.p.a.meteorologyresistacousticstopologyelectricityspidersbusiness termscontrol theorypost-transition metalsk.v.scientific techniquesmineralogyelectronic test equipmentheat transferglasssubstratenuclear physicsatomic physicsmetrologyconcepts in physicsprecious metalsgeneticsmicroscopyfeaturemicroncirclescrystallographylightbinary operationstransducerscyberneticsgeometrical opticsc.m.spheresphotometry
From  David Botsch on January 20th, 2012 327 plays