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2017 CNF HHMI KEP PARADIM REU Nano-Convocation - Session 2_001
From
James Overhiser
February 15, 2019
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external bias
external field
real space
plan view
structural change
alternating current
huge amounts
growth parameters
ram
characteristic reflections
structural characterization
liquid nitrogen
resist heavy
thin film
plane lot
individual layers
random access memory
tensile strain
caption complete
superconducting thin film
liquid nitrogen temperature
glass slide
lattice constant
compressive strain
face pure
reu
starting point
energy density
high energy
+ 40 more
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PARADIM
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