Search for tag: "thickness"

10 Media

12:03 BEATRIZ AVILA_RIMER REU 2021 BEATRIZ AVILA_RIMER REU 2021	BEATRIZ AVILA_RIMER REU 2021 REU final research presentation August 16, 2021 at Cornell University. image sample occupancy occupancies cadmium point intensity gap thickness peaks instances atoms process profile dots pattern increase defects issue threshold From James Overhiser 8 plays
47:17 CNF PROLITH Video Training CNF PROLITH Video Training	CNF PROLITH Video Training Operational training video for PROLITH by KLA-Tencor. This software may be used by CNF registered University students or CNF staff ONLY. focus exposure photoresist feature thickness dose coating process output stack mask lines angle film space latitude From David Botsch 45 plays Content Categories Lectures Creation Date August 27, 2021 Creator 1 First Name Garry Creator 1 Last Name Bordonaro Creator 1 Role Author or Writer Creator 1 NetID gjb1 Creator 2 First Name David Creator 2 Last Name Botsch Creator 2 Role Administrator Creator 2 NetID dwb7 Language English Searchable Yes
57:10 Hot Materials talk: “How wacky oxides have… Hot Materials talk: “How wacky oxides have improved transistors.”	Hot Materials talk: “How wacky oxides have improved transistors.” Zoom Recording ID: 91243956422 UUID: XnyRn5vOTM2ki3k/jfRNMg== Meeting Time: 2021-06-24T15:59:08Z silicon materials oxide dioxide transistors semiconductor problem intel thing transistor oxides dielectric material things lot roadmap thickness hafnium thermodynamics gap gate From James Overhiser 5 plays
07:04 CCE Oswego 4-H Juice Cup Yarn Monsters CCE Oswego 4-H Juice Cup Yarn Monsters	CCE Oswego 4-H Juice Cup Yarn Monsters today cooking utensils friendly master scissors demonstration caption complete perfect shirt tablet deserve thickness spread finger sewing equipment friend eyeballs hand tools monster sewing regular press cardboard imperial units center button school lunch thing slide decorate clean making From Linda Brosch 7 plays Content Categories Other
56:49 SYSEN 5300 Remote Instruction SYSEN 5300 Remote Instruction	SYSEN 5300 Remote Instruction systems engineering ejc85 key problem actuarial science key process factors affect higher yield quality control wide range momentum factor quality international law caption complete statistical methods website design design factor water water water oral communication environment costs mental condition maintenance lower cost robust design statistical charts and diagrams system reliability control chart failure rate design of experiments paper supplier statistical ratios reliability engineering statistical terminology failure product design holiday season financial ratios factor combination cost effective process parameters middle factors e-commerce nasa positive level average thickness operations research environmental factor robust product statistical theory From E. Cornelius 18 plays
08:06 2017 REU Jonathan Chandonait CNF HHMI KEP… 2017 REU Jonathan Chandonait CNF HHMI KEP PARADIM REU Nano-Convocation	2017 REU Jonathan Chandonait CNF HHMI KEP PARADIM REU Nano-Convocation d.n.a. laser diffraction u.v. positive resist chemical composition tiny molecules concepts in physics silicon dioxide pressure drop biological function reu mirror stack electric potential i.t.t. l.d. electricity absorption d.v.r. optical devices molecules signal processing taper channel material smooth surface oxides opposite direction protein spot initial pressure distributed brag social concepts substrate p.d.s. cognition microscopy digital electronics electric field optics pretty cool bacterial mechanics fluid flow philosophical terminology electrons moving electric current beam scattering design single molecule wavelength photon reflections nanometer bacteria machines cell biology optical microscope substract print international technology roadmap for semiconductors lithography nodes thickness cnf pretty good plasma clean normal electronic molecular machines double helix crystal quality anthropology tuning fork stamping method extrusion loading electrical current chemical processes geometry electric material refraction immune cells k.p.h. 300 nanometer polymer brushes electronic signal image processing reflector $0.00 nanometers electrostatics opportunity fiction literature values megahertz wave molecular biology electronic device d.v.r. stacks deep u.v. unique mechanical properties project management physical quantities motor proteins nanometer protein spots semiconductor device fabrication electronic circuits negative resist d.n.a. binding matter printing ultra smooth surface spectroscopy electrical engineering problem mechanics mechanical system d.b. silicon wafer incubation time crystals metaphysics caption complete documents sandwich structure atomic layer deposition diffraction grating roughness potential inside talks acoustic wave gold electrodes mediasite compatibility electromagnetism photonics side wall diffraction walls purification pattern protein $25.00 k.p.h. photo resist behaviorism biotechnology chemistry tantalum oxide polymer chains From James Overhiser 6 plays
59:21 Valence EELS, High Energy Resolution Valence EELS, High Energy Resolution	Valence EELS, High Energy Resolution 2017 PARADIM SUMMER SCHOOL Low loss EELS David Muller optical spectroscopy formal sciences concepts in physics silicon rich silicon dioxide chemical elements band gap scattering electron density lowest energy feature reducing agents valence electrons quick rule pyrotechnic fuels electron microscope waveguide mode nuclear physics percent radius electron real trouble dielectric boundary conditions nice big factorial and binomial topics tightly bound electric field spatial resolution single scattering optics sample thickness interface plasma nano particles optical gap direct bandgap phosphates particle physics fluid dynamics high energy electron atomic physics dielectric responses biology and pharmacology of chemical elements liquid cell multiple scattering electron beam energy resolution tiny signal single particle transition cherenkov radiation electron gas free electron gas optical transition energy loss energy lost characteristic angle free electronic energy filter low energy charge oscillations valence region surface plasma toxicology free path silicon oxide optical spectra bulk material exit haitian call auspex fourier analysis quantum mechanics big background image charge electrostatics lastic scattering nice thing interesting standing wave bessel function boundary conditions ion image single particle standing wave modes funny feature electron states scattering event direct gap good free electron physical quantities energy loss function vector calculus dietary minerals absorption and radiative transfer (optics) electrical engineering thick sample field lines length scale electronics terminology electrodynamics phoria transform radiation sensitive caption complete hof plasma frequency log scale experimental particle physics hof epsilon semiconductor materials higher energy high frequency atomic resolution interface mode good news harmonic oscillator special relativity dielectric function diverges logarithmically shine light couple 100 volt t.m. incredibly complicated bad news electromagnetism energy range cherenkov modes 100 volt spherical modes linear operators in calculus chemistry bulk plasma From James Overhiser 87 plays
16:19 2016 REU Maya Martirossyan PARADIM REU… 2016 REU Maya Martirossyan PARADIM REU Convocation	2016 REU Maya Martirossyan PARADIM REU Convocation renting interesting properties high temperature interesting applications concepts in physics side walls chemical elements flower pattern superhard materials thickness 2nd design electron microscopy difference generation devices exposure time electricity mineralogy transparent metallurgy functional groups pyrotechnic fuels materials science super lot grain structures dimensional material magnetic field electron nanomaterials fact data 1st thing scattered electrons precursor flow $4.00 system large scale hexagon system post-recession charge carriers microscopy group microscopy atomic lot banking scale image cognition fourfold symmetry optics l.f. percentage titanium platinum 1st presenter philosophical terminology 210 kelvin selenium atoms design measurement crystallography ray diffraction particle physics curing agents $210.00 kelvin chemical properties reu cnf vast majority semiconductor scanning transmission electron charge carrier emerging technologies model layer statistical terminology deposition ratios grain boundaries lattice orientation color composite image geometry graphic orientation lined dots electrical transport misaligned dots alpha psi characterization semiconductors magnetic property microscopes future work thin film hexagonal lattice resolution image transition metals quantum mechanics tools hall fact arts rural community development natural philosophy growth process white circle question photographic processes fiction charge care inorganic silicon compounds transition metal percentage electromagnetism quantum dot accountancy professor david $45.00 degrees magnetism previous film p.c.t. tool silicon nitrite grain orientation transmission electron microscopy physical quantities silicon nitride condensed matter physics circle represents semiconductor device fabrication rectangular confounding variables p.c.t. magnetostatics highly misaligned layer call fact crystal structure atomic lattice false color composite silicon wafer nano wire metals characterize dislocation behavior nitrides metaphysics caption complete l.f. electronic properties quantum electronics darkfield transmission electron dimensional system chrome gold flower design semiconductor materials atomic resolution super lattice single material local super lattice mismatch green boundaries mediasite fabrication business law architectural design aesthetics manufacturing aspect ratio $210.00 calvin voltage drop photo resist From James Overhiser 56 plays
29:26 CNF NanoCourses 2004 – Section 3.6: CMP… CNF NanoCourses 2004 – Section 3.6: CMP (Daniel Woodie)	CNF NanoCourses 2004 – Section 3.6: CMP (Daniel Woodie) semiconductor device fabrication natural resources solutions cosmetics chemicals surface roughness vacuum data analysis dispositional beliefs length dietary minerals structure process mineralogy ammonium compounds sociology index food ingredients i.b.m. particle technique coatings economic geology liquids polishing microstructure native element minerals polymers phases of matter materials computer hardware companies statistical terminology materials science force film thickness metrology cryptography political philosophy oxide occupational safety and health electric and magnetic fields in matter oxoanions hydroxides stochastic processes silicon oxide phase transitions sociocultural evolution economic geography functions and mappings integrated circuits commerce electrical conductors metalworking terminology colloidal chemistry fluid dynamics biology and pharmacology of chemical elements polyurethanes cardiology pyrotechnic fuels reducing agents sociological theories solvents futurology industrial processes mechanical engineering packaging materials polish condensed matter physics human geography production and manufacturing semiconductor companies walking philosophical terminology measuring instruments dram sedimentary rocks transition metals formal methods technology mathematical analysis grinding and lapping concepts in physics oxides marketing manufacturing atmospheric thermodynamics dielectrics 3play_vodcnf_standard From David Botsch 81 plays
23:01 CNF NanoCourses 2004 – Section 4.3: Optical… CNF NanoCourses 2004 – Section 4.3: Optical and Electrical	CNF NanoCourses 2004 – Section 4.3: Optical and Electrical conductivity properties electrical systems analog circuits analytic geometry electronics terminology electrical engineering thin films oxide semiconductor device fabrication semiconductors thin film polarisation group theory systems theory caption complete photo resist light electricity matter compensator concepts in physics optics material thermodynamics large area interference length electronics resistance software electric current thickness historical scientific instruments measure design metrology measurement temperature differential calculus chemical elements operating system distributions bootable from read-only media geometrical optics current source type theory algebra physical objects substrate topology spectroscopy heat transfer concentration materials science technique bit difficult systems geometry web 2.0 3play_vodcnf_standard From David Botsch 72 plays