Search for tag: "sensitivity"

Diffraction (Part 2)

2017 PARADIM Diffraction part 2 David Muller

central beamnoise sourceaperture sizen.c.concepts in physicsideal d.q.2nd thingreadout noisehigh dynamic rangemental planethermal noiselong timechannel gain variationsquantum electrodynamicsdigital imagingcount rateoptical devicesfraction patternpico ampslong rangebiological imagingrange electric fieldshuge amountsignal processinggeologyd.p.photographythin pixelmagnetic fieldhole pezc.c.d. cameraelectronicspoisson distributiondiffraction patternelectron hopepoint spread function200 kilovolts$16.00 pico ampsneighboring pixelsquare rootmass signalstandard deviationdetective quantum efficiencyspatial frequencyopticsreal spaceresearch methodsenergy distributionmagnetic ripplesd.q.single electron sensitivityparticle physicsnarrow pixelspace measurementslowly varyingabled sphereatomic physicsimaging modeelectric fieldenergy depositedminus sigmapretty goodemerging technologieselectron beamnoisedynamic rangepoint $16.00 picomagnetismdock noisesoft moonk.v.pulse counting detectorlastic imaging modese.q.low energypretty darn goodelectrons arrivemicron pixelfire electronrandom noisemicroscopesperfectly lineardiscrete distributionselectron producesmass imagepercent variationtechnical detailselectron hole payq.e.statisticselectrostaticselectronics terminologyquantum mechanicsfield imagesingle actorideal detectormultiple pixelsgrain contrastsystems theoryelectron hole1st timehigh count ratescharge carriershuge numberdiffraction spotphysical quantitiesdigital photographyfull diffraction patternnoise timepulse countingbeam energyhigh voltagesoutput noisemilli 2nddynamical systemsoutput signallow count ratedimensional datadigital signal processingmomentum transfercaption complete$150.00 microninformationpixel array detectorc.c.d.1000 electronslaboratory equipmentcyberneticsatomic resolutionscientific methodfinite sizefundamental limitnoise ratiofraction spotquantum chemistryt.m.dataevaluation methodselectromagnetismmomentum operatorincident electrondiffractionprobability current flowrough rulebeam currentwave functiondiffraction work
From  James Overhiser on February 15th, 2019 9 plays

CNF NanoCourses 2004 – Section 4.4: Auger and Thin Film An

metalloidschemical elementsmultinational companiesthermodynamicsbuilding materialselectrical conductorsmeasuring instrumentsopticsphysical chemistrymaterialgroup theoryionstransition metalsmicroscopysystems sciencegeochemistrycarboncartographyoncologynative element mineralssensitivityspectroscopyenergy levelsgallium arsenidecarbon formsmicroscopescondensed matter physicsproblem solvingchemical propertiesiarc group 2b carcinogensmaintenanceergonomicskinematicsquantum chemistryscientific techniquesmass spectrometryanalytical chemistryphases of matterlaboratory techniquessoil contaminationcobolatomic physicsstatistical terminologymaterials sciencereliability engineeringdifferential calculusrefractory materialsobject-oriented programming languagescompound semiconductorsmetallurgycharacteristicvacuumfailureclassical mechanicsmoleculesphysical objectsfood coloringsiarc group 1 carcinogensprecious metalselectronicscoatingsdensityelementary algebrasemiconductor materialsbusiness termsspectrumconcepts in physicselectromagnetismheat transferphilosophical terminologyhouse typescharacterizationdietary mineralsenergy (physics)c.h.f.occupational safety and healthnonmetalsmolecular biologyscientific terminologytransitionpyrotechnic fuelsquantum electrodynamicsmeasurementelectromagnetic radiationtoxicologyteratogensparticle physicssampleindustrial processescontinuum mechanicschemical reactionscharge carrierscaption completeelectronquantum mechanicsforms of energygeographynuclear physicspnictogenschemistryenergy conversionscatteringthin filmsmolecular physicssystems theoryreducing agentscomputer programmingprogramming languageselectrodes
From  David Botsch on January 20th, 2012 55 plays