Search for tag: "optics"

CNF 30th - Nanostructures and X rays for Nano Characterization

From  Karlis Musa on February 19th, 2020 2 plays

Greatest Hits of MBE (Schlom)

2019 Cornell Summer School LINK to presentation slides

summerindium arsenidekey aspectlead oxideconcepts in physicstemperature techniqueceiling technologycold wallatomic stepsspray canscompound semiconductorsheat transferhot walldensityquantum hallinorganic compoundsseparate sourcesengine technologym.b.e.teachingarchitectural elementsgrowth conditionsarsenic sourceoxidesunit cellsvacuumcritical current densitydiffraction patternlaboratory equipmentsuper latticeindependent controlopticsoscillationhuge differencestep edgebell labsjoseph allisonschool typesfilm reportediii-v compoundsresistivity ratiohardware (mechanical)oxidizing agentsgrowth modeoral communicationjohn arthuralcatel bell laboratoriesspray paintingelectron beamgreat thingdedicated shuttersarsenic richvapor pressurearsenic pressurepressurebroken equipmentlosing arsenicgas phasefaculty memberhigher pressuresunderlying substrategrowth windowmolecular beamgallium arsenidetemperaturehigh mobilitythermodynamicsgasesquantum mechanicssingle phasehigh performancesingle modelelectromagnetismvolatile speciesread oscillationschemical engineeringgreat questionepa taximap attackphysical quantitiescondensed matter physicsmodulation dopingmeteorologysummer schoolelectrical engineeringstate functionsmagnitude higherultra high vacuum$76.00 inchhighest mobilityseparate temperaturecaption completegreat capabilityquantum electronicscopper gasketlong wordsemiconductor materialsbanking termsarsenidesgrowth ratevacuum chambersuperconductivitypayment systemsknife edgeiarc group 1 carcinogensfree pathfusion lengthm.b.educational psychologyzinc oxidelow temperaturenational medale-commerceroom temperatureindia martian nightnobel prizefractional quantum hall
From  James Overhiser on July 30th, 2019 119 plays

2017 REU Jonathan Chandonait CNF HHMI KEP PARADIM REU Nano-Convocation

d.n.a.laser diffractionu.v.positive resistchemical compositiontiny moleculesconcepts in physicssilicon dioxidepressure dropbiological functionreumirror stackelectric potentiali.t.t.l.d.electricityabsorptiond.v.r.optical devicesmoleculessignal processingtaper channelmaterialsmooth surfaceoxidesopposite directionprotein spotinitial pressuredistributed bragsocial conceptssubstratep.d.s.cognitionmicroscopydigital electronicselectric fieldopticspretty coolbacterial mechanicsfluid flowphilosophical terminologyelectrons movingelectric currentbeam scatteringdesignsingle moleculewavelengthphoton reflectionsnanometerbacteriamachinescell biologyoptical microscopesubstract printinternational technology roadmap for semiconductors lithography nodesthicknesscnfpretty goodplasma cleannormal electronicmolecular machinesdouble helixcrystal qualityanthropologytuning forkstamping methodextrusion loadingelectrical currentchemical processesgeometryelectric materialrefractionimmune cellsk.p.h.300 nanometerpolymer brusheselectronic signalimage processingreflector$0.00 nanometerselectrostaticsopportunityfictionliterature valuesmegahertz wavemolecular biologyelectronic deviced.v.r. stacksdeep u.v.unique mechanical propertiesproject managementphysical quantitiesmotor proteinsnanometer protein spotssemiconductor device fabricationelectronic circuitsnegative resistd.n.a. bindingmatterprintingultra smooth surfacespectroscopyelectrical engineeringproblemmechanicsmechanical systemd.b.silicon waferincubation timecrystalsmetaphysicscaption completedocumentssandwich structureatomic layer depositiondiffraction gratingroughnesspotentialinside talksacoustic wavegold electrodesmediasitecompatibilityelectromagnetismphotonicsside walldiffractionwallspurificationpattern protein$25.00 k.p.h.photo resistbehaviorismbiotechnologychemistrytantalum oxidepolymer chains
From  James Overhiser on February 18th, 2019 1 plays

Valence EELS, High Energy Resolution

2017 PARADIM SUMMER SCHOOL Low loss EELS David Muller

optical spectroscopyformal sciencesconcepts in physicssilicon richsilicon dioxidechemical elementsband gapscatteringelectron densitylowest energy featurereducing agentsvalence electronsquick rulepyrotechnic fuelselectron microscopewaveguide modenuclear physicspercent radiuselectronreal troubledielectric boundary conditionsnice bigfactorial and binomial topicstightly boundelectric fieldspatial resolutionsingle scatteringopticssample thicknessinterface plasmanano particlesoptical gapdirect bandgapphosphatesparticle physicsfluid dynamicshigh energy electronatomic physicsdielectric responsesbiology and pharmacology of chemical elementsliquid cellmultiple scatteringelectron beamenergy resolutiontiny signalsingle particle transitioncherenkov radiationelectron gasfree electron gasoptical transitionenergy lossenergy lostcharacteristic anglefree electronicenergy filterlow energycharge oscillationsvalence regionsurface plasmatoxicologyfree pathsilicon oxideoptical spectrabulk materialexit haitiancall auspexfourier analysisquantum mechanicsbig backgroundimage chargeelectrostaticslastic scatteringnice thinginteresting standing wavebessel functionboundary conditionsion imagesingle particlestanding wave modesfunny featureelectron statesscattering eventdirect gapgood free electronphysical quantitiesenergy loss functionvector calculusdietary mineralsabsorption and radiative transfer (optics)electrical engineeringthick samplefield lineslength scaleelectronics terminologyelectrodynamicsphoria transformradiation sensitivecaption completehofplasma frequencylog scaleexperimental particle physicshof epsilonsemiconductor materialshigher energyhigh frequencyatomic resolutioninterface modegood newsharmonic oscillatorspecial relativitydielectric functiondiverges logarithmicallyshine lightcouple 100 voltt.m.incredibly complicatedbad newselectromagnetismenergy rangecherenkov modes100 voltspherical modeslinear operators in calculuschemistrybulk plasma
From  James Overhiser on February 15th, 2019 26 plays

Ronchigrams

2017 PARADIM SUMMER SCHOOL Ronchigrams Peter Ercius

aperture sizedark field detectorconcepts in physicssmaller probespherical aberrationlargest probegraduate schoolguy namedhigher orderstrong magneticlong timeelectron microscopyorder termsphase changezone axispretty easyspecimen opticsoptical devices0.11 nanometersfraction patternlocal magnificationlarger apertureelectron microscopecorrected scopeaberration corrected microscopeprevious imagesphotographymagnetic fieldraunchy gramelectronphase shiftstem probeconvergence angleelectron diffraction patterndiffraction patternscience of photographydiffraction spaceelementary geometrypost specimenrate pathsmall screenengstromopticsobjective lenscirclesaberration shapemicrons leftlow frequencynice probecorrected stemsmall amountsemi anglepost specimen lensesinfinite magnificationfocus seriesmonolithic detectorseabed patternranch grahamflat regionatomic physicsaberration corrected scopeelectron lenspretty closea.t.f.focal seriesdiffraction buttonaberration correctoverlap regionbright field detectorlargest aperturehigh resolutionwine glasscarbonk.v.lot simplerimage correctaberration correctedlengthround lens300 k.v.quote unquotelarge focusradio symmetryfocused probeimage processingbbc radio 4 programmescontrast transferecclesiastical titlescentimetre–gram–second system of unitsf.b.i. techphysical opticsimage shiftflat phasemicron diameter aperture200 k.b.geometrical opticsamorphous materialalpha angleaberration correctorc.s.aberration correctionshadow imagesphere collaborationphysical chemistrydigital photographyhigher order aberrationsbeam electron diffractionf.b.i.100 percent2nd ordercsubcaption completestar aberrationcrystallographyanglehigh anglesc.c.d.virtual detectoroptical axisautomated alignmentparticle physicsaberration functionpixilated detectorcomputer visionlens currentatomic resolutioncentral spikeweird aberrationshigher order termsperfect lenst.m.3rd orderpriest specimen lensesk.b.double overlapsi derived unitscorrected microscopediffractionsingle positiontiny bitorder sphericalchemistryconvergent beam electronstem
From  James Overhiser on February 15th, 2019 33 plays

Linear Imaging Theory

2017 PARADIM Linear Imaging Theory Robert Hovden

d.n.a.dark fieldaperture sizeobject functiontotal intensitycollaboration increasesconcepts in physicsconvergence angleareaspherical aberrationwide rangecovering todaygeometric shapesd.n.a. structurecentral minimumelectron microscopyfocal pointintensity increaseslinear imaging modelwave vectorscontrol theoryoptical devicescollection anglelarger apertureelectron microscopehigh anglearchitectural elementssignal processingphotographyhigh pass filtertransfer functionuncorrected systemphase shiftdarkfield regimefunctional formscattered electronshigher frequencybright field stemegyptian artefact typesdiffraction patternscience of photographypoint spread functionhigh intensity probeelementary geometryintegralsspatial frequencyopticsobjective lensbright field regimebright spotsreal spacelow frequencyreciprocal spaceblurring contributionsphere collaborationuncorrected instrumentcharacteristic dimensionincoherent imaging conditionsurfacesaperture functionwave frontatomic physicsimaging modecontract transfer functionwhite noisescanning transmission electroncohere imagingprevious lecturedistant planeelementary shapesstemhigher angleshigh resolutionincoherent linear imagemil ratingdetector geometriesfield conegeometrytypes of functionsaberration correctedconstant phaselengthlower frequencieschromatic aberrationconic sectionsamplitude squaredaberration freescientific techniquesmicroscopesmeasuring instrumentsintensity squaredoptic axisintensity decreasescontrast transferdiffraction limitstem imageindividual atomradio spectrumincoherent imagingquantum mechanicsaberration free probemultivariable calculuspeople metersfocal planebright fieldlow angleamateur radiosystems theoryimage planecoherent imaging conditioncollecting electronsblurring functiontransmission electron microscopyphysical quantitiesdigital photographyangular spreaddouble integralcoherent imaginglargest rangeface shifthigher order aberrationsraleigh criterionpiofairly interpretabletransmission electron microscopesquare pulsegeometrical opticsdigital signal processing1st ordercaption completeprobe tailsnyquist limitblue curvesubroutinesbroadcastingfilter frequency responsemaximum frequencyhigh frequencycaustic curvehand sidelow pass filterspatial coordinatesatoms closercoherent imagesparrow criterionstructural systempico meterdark backgroundfrequency spaceoptimal aperturet.m.complex conjugatecontrast transfer functionwave functionmeasure ultimatelyimaging conditionannular darkfieldincoherent imaging modeatomic numberfield stematomic columninelastic interactionsnobel prizeangle mediumchemistryfocal imagingprobe size
From  James Overhiser on February 15th, 2019 25 plays

Diffraction (Part 2)

2017 PARADIM Diffraction part 2 David Muller

central beamnoise sourceaperture sizen.c.concepts in physicsideal d.q.2nd thingreadout noisehigh dynamic rangemental planethermal noiselong timechannel gain variationsquantum electrodynamicsdigital imagingcount rateoptical devicesfraction patternpico ampslong rangebiological imagingrange electric fieldshuge amountsignal processinggeologyd.p.photographythin pixelmagnetic fieldhole pezc.c.d. cameraelectronicspoisson distributiondiffraction patternelectron hopepoint spread function200 kilovolts$16.00 pico ampsneighboring pixelsquare rootmass signalstandard deviationdetective quantum efficiencyspatial frequencyopticsreal spaceresearch methodsenergy distributionmagnetic ripplesd.q.single electron sensitivityparticle physicsnarrow pixelspace measurementslowly varyingabled sphereatomic physicsimaging modeelectric fieldenergy depositedminus sigmapretty goodemerging technologieselectron beamnoisedynamic rangepoint $16.00 picomagnetismdock noisesoft moonk.v.pulse counting detectorlastic imaging modese.q.low energypretty darn goodelectrons arrivemicron pixelfire electronrandom noisemicroscopesperfectly lineardiscrete distributionselectron producesmass imagepercent variationtechnical detailselectron hole payq.e.statisticselectrostaticselectronics terminologyquantum mechanicsfield imagesingle actorideal detectormultiple pixelsgrain contrastsystems theoryelectron hole1st timehigh count ratescharge carriershuge numberdiffraction spotphysical quantitiesdigital photographyfull diffraction patternnoise timepulse countingbeam energyhigh voltagesoutput noisemilli 2nddynamical systemsoutput signallow count ratedimensional datadigital signal processingmomentum transfercaption complete$150.00 microninformationpixel array detectorc.c.d.1000 electronslaboratory equipmentcyberneticsatomic resolutionscientific methodfinite sizefundamental limitnoise ratiofraction spotquantum chemistryt.m.dataevaluation methodselectromagnetismmomentum operatorincident electrondiffractionprobability current flowrough rulebeam currentwave functiondiffraction work
From  James Overhiser on February 15th, 2019 24 plays