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Ronchigrams

2017 PARADIM SUMMER SCHOOL Ronchigrams Peter Ercius

aperture sizedark field detectorconcepts in physicssmaller probespherical aberrationlargest probegraduate schoolguy namedhigher orderstrong magneticlong timeelectron microscopyorder termsphase changezone axispretty easyspecimen opticsoptical devices0.11 nanometersfraction patternlocal magnificationlarger apertureelectron microscopecorrected scopeaberration corrected microscopeprevious imagesphotographymagnetic fieldraunchy gramelectronphase shiftstem probeconvergence angleelectron diffraction patterndiffraction patternscience of photographydiffraction spaceelementary geometrypost specimenrate pathsmall screenengstromopticsobjective lenscirclesaberration shapemicrons leftlow frequencynice probecorrected stemsmall amountsemi anglepost specimen lensesinfinite magnificationfocus seriesmonolithic detectorseabed patternranch grahamflat regionatomic physicsaberration corrected scopeelectron lenspretty closea.t.f.focal seriesdiffraction buttonaberration correctoverlap regionbright field detectorlargest aperturehigh resolutionwine glasscarbonk.v.lot simplerimage correctaberration correctedlengthround lens300 k.v.quote unquotelarge focusradio symmetryfocused probeimage processingbbc radio 4 programmescontrast transferecclesiastical titlescentimetre–gram–second system of unitsf.b.i. techphysical opticsimage shiftflat phasemicron diameter aperture200 k.b.geometrical opticsamorphous materialalpha angleaberration correctorc.s.aberration correctionshadow imagesphere collaborationphysical chemistrydigital photographyhigher order aberrationsbeam electron diffractionf.b.i.100 percent2nd ordercsubcaption completestar aberrationcrystallographyanglehigh anglesc.c.d.virtual detectoroptical axisautomated alignmentparticle physicsaberration functionpixilated detectorcomputer visionlens currentatomic resolutioncentral spikeweird aberrationshigher order termsperfect lenst.m.3rd orderpriest specimen lensesk.b.double overlapsi derived unitscorrected microscopediffractionsingle positiontiny bitorder sphericalchemistryconvergent beam electronstem
From  James Overhiser on February 15th, 2019 22 plays

CNF NanoCourses 2004 – Section 1.4: E-Beam Lithography (Al

spintronicsdigital photographye.b.m.analytic geometrychemical propertiessemiconductor device fabricationcadgeometric shapescaption completecommunication designnatural philosophygraphic designscatteringnanometerstructural engineeringgeometrypatternmechanical vibrationselectrical componentsscience and technology in spainlithography (microfabrication)electrical engineeringp.m.a.optical devicescartographyhistorical scientific instrumentssystemabsorption and radiative transfer (optics)dielectricsaudio engineeringalgebrametalsphotonicsexposequantum electrodynamicsfieldelectronicssemiconductor materialsprintmakingmechanicsmeterlensesgeodesysystems theoryelectroncomputer graphicsearthquake engineeringvideo signalelectronic engineeringk.b.colormicroscopesimage processingspectroscopykinematicsaestheticselectromagnetismnavigational equipmentquantum mechanicssurfacesalignmentclassical mechanicsparticle physicsi.c.m.architectural elementssystemsphotographyaudio effectsnandquadrilateralspixelvisiongeography terminologydietary mineralsphilosophical terminologyopticsdimensional instrumentsthin film depositionmaterials scienceforceegyptian artefact typesbiology and pharmacology of chemical elementsstructureresolutioni.p.a.meteorologyresistacousticstopologyelectricityspidersbusiness termscontrol theorypost-transition metalsk.v.scientific techniquesmineralogyelectronic test equipmentheat transferglasssubstratenuclear physicsatomic physicsmetrologyconcepts in physicsprecious metalsgeneticsmicroscopyfeaturemicroncirclescrystallographylightbinary operationstransducerscyberneticsgeometrical opticsc.m.spheresphotometry
From  David Botsch on January 20th, 2012 324 plays