CAM Colloquium - Rick Johnson (Cornell ECE) - Computational Art History: Matching Manufactured Patterns in Art Supports
From E. Cornelius
Three projects will be described exploiting digital signal processing in analysis of images of art that reveal manufactured features in their support materials: 1) Thread count patterns among paintings on canvas by van Gogh and by Vermeer, 2) Photographic paper surface textures among black and white photographs of the 20th century as photography emerged as a fine art form, and 3) Chain line patterns in the laid paper of Rembrandt's etchings. In each of these applications, matching produces evidence regarding dating, authenticity, and the artist's studio practice. Locations of scientific quality image datasets recently made accessible to academic researchers for each of these three problems will be identified.